Multitest - InCarrier®

InCarrier®

Multitest InCarrier® is a strip-like device carrier for single devices that combines the advantages of the singulated device test process with the advantages of high parallel strip test.

Learn more about the InCarrier® process >>

Features

no singulation after test
full device traceability
re-test option on original equipment
temperature range: -55° to +155°C
usable as transport means for burn-in prior to final test

Handling Solutions for

leaded and leadless devices
large and even smallest package sizes down to 1 x 1 mm
ASIC test
MEMS calibration and test

Applications

consumer
automotive and power devices
RF and communication
logic, analog and microcontrollers
flash memory

InCarrier® Loader and Sort-Unloader

supported input media:

JEDEC tray to carrier
tube to carrier
bulk to carrier
wafer frame to carrier

supported output media:

carrier to JEDEC tray
carrier to tube
carrier to bulk
carrier to tape&reel

For more information please contact us >>


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