| Rosenheim, January 2012 | | Pogo-Style Spring Probes Reaching Their Limits: High-Performance Requirements Drive New Solutions |  | | The popularity of pogo pins has increased greatly over the years with the increase in device speeds and bandwith requirements. The pins also have lower inductance for cleaner power delivery. An additional benefit is offered over traditional burn-in sockets: It is capable of contacting arrayed packages and testing arrays of devices, as when testing devices on strips, on film-frames, or at wafer level. more >> |
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| Rosenheim, January 2012 | | First MT9510 x16 Shipped | | We are pleased to announce the first shipment of our new tri-temp 16-site pick-and-place platform. The MT9510 x16 will be deployed at an Asian high volume test site.
Based on the technology of the well-established MT95XX platform, the MT9510 x16 leverages our expertise in temperature testing and DUT handling to support the state-of-the-art high parallel test for the complete temperature range from -55 to +175°C. more >> |
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| Rosenheim, January 2012 | | Increase PCB Lifetime by up to 100 Percent — DuraPad™ significantly reduces pad wear | | Multitest’s proprietary DuraPad™ surface has been proven to significantly reduce the effects of pad wear caused by pogo pin style contactors.
Specifically, fine-pitch boards of 0.5 mm or below and boards for resistance sensitive testing are particularly vulnerable to pad wear. more >> |
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| Rosenheim, December 2011 | | Multitest MEMS Test and Calibration Equipment Now Available for MT9510 Pick-and-Place Test Handler | | We are pleased to announce that we shipped the first Multitest MEMS equipment for the MT9510 pick-and-place test handler to an IDM in the U.S. This new combination is based on the two well-established platforms: MT MEMS and MT9510.
The installation is for MEMS gyroscope test and has already been successfully installed. more >> |
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| Rosenheim, December 2011 | | Smarter and More Complex Devices Increase High-Speed Requirements of Final Test — Reaching the Limits | | Multitest RF experts have been consulting customers on signal integrity for many years. In his recent article, Ryan Satrom, Signal Integrity Engineer at Multitest Minnesota, reviews the latest challenges.
For several years, there has been a consistent increase in semiconductor device frequencies. This trend is forcing test engineers to consider device frequency requirements. more >> |
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| Rosenheim, November 2011 | | Multitest Names New VP of Global Sales & Marketing | | Multitest is pleased to announce the appointment of James Quinn to Vice President of Global Sales & Marketing effective November 14, 2011.
Based in Rosenheim, Jim will be responsible for managing customer relationships throughout the global market. more >> |
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| Rosenheim, November 2011 | | Multitest’s 2012 Training Schedule is Now Available | | Multitest is pleased to announce that the 2012 training schedule is now available online.
Multitest’s training courses are designed to familiarize the trainee as easily and quickly as possible with the most important features of the test handlers. more >> |
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| Rosenheim, November 2011 | | Test Interface Boards for Wafer Level Testing: | | UltraFlat™ process meets requirements of high parallel vertical probe card applications
For probe card applications such as high parallel memory, the requirements for the PCB flatness have become crucial. For optimizing MLO/MLC attachments and contact element interfaces, a better, flatter surface is needed. Additionally, flatter PCBs require less compliance from the probe interface and reduce interface wear and introduce less stress. more >> |
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| Rosenheim, November 2011 | | Multitest Offers MT Pro Support Program | | Multitest introduces the MT Pro Support Program for complete after-sales support.
The MT Pro Support Program encompasses the complete after-sales support services offered by the company. Currently, the program includes the Recommended Spare Parts Lists, the Top-X List, and the Preventive Maintenance Kit Program. more >> |
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| Rosenheim, October 2011 | | Multitest Offers Leading Cantilever Technology for all Handler Brands | | Multitest contactors prove substantial advantages even on non-Multitest test handlers
Multitest Cantilever style contactors are often used on non-Multitest, third-party test handlers. This complements Multitest’s Plug & Yield offering and makes the Multitest expertise available to all IDMs and test houses, independent of the handler brand they use. more >> |
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