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MT MEMS
Test Module

Winner of the:
> Test & Measurement World's "Best in Test" 2007 Award
Read more about the winning product: InFlip MEMS >>
Features

  • modularity replaces cost-intensive custom designed machinery
  • standard handler plus sensor module
  • increased reliability, quicker availability, cost-effectiveness, reduced floor space, worldwide support
  • tri-temp solution
  • special contacting solutions for sensor testing
Handling Solution for

  • SO and MLF devices with a pitch down to 0.5mm
  • quad site testing
  • tri-temp from –55 to 155°C
  • bar and dot matrix code reading
  • wide package range: BGA, SO, QFN, LGA, SOT
Realized Solutions

  • high and low g accelerometers
  • pressure sensors
  • gyroscopes
  • optical sensors
  • magnetic sensors
  • MEMS strip test module
 
White Papers
 Trends in MEMS Test - Market Briefing at Electronica 2008 >> 
 
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