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InCarrier™

Multitest InCarrier™ is a strip-like device carrier for single devices that combines the advantages of the singulated device test process with the advantages of high parallel strip test.
 
 Learn more about the InCarrier™ process >> 
 
 
 
 
 
 
 
 
Features

  • no singulation after test
  • full device traceability
  • re-test option on original equipment
  • temperature range: -55° to +155°C
  • usable as transport means for burn-in prior to final test
Handling Solutions for

  • leaded and leadless devices
  • large and even smallest package sizes down to 1 x 1 mm
  • ASIC test
  • MEMS calibration and test
Applications

  • consumer
  • automotive and power devices
  • RF and communication
  • logic, analog and microcontrollers
  • flash memory
 
InCarrier™ Loader and Sort-Unloader
supported input media:
  • JEDEC tray to carrier
  • tube to carrier
  • bulk to carrier
  • wafer frame to carrier

supported output media:
  • carrier to JEDEC tray
  • carrier to tube
  • carrier to bulk
  • carrier to tape&reel
For more information please contact us >>